An AI algorithm converts 2D electron microscope images into accurate 3D structures, cutting analysis time and cost to ...

Optical and scanning electron microscope images of a nano-LED device that uses AC power instead of DC power, which could be a game-changer for sharper near-eye displays.

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

LEDs are essential components in near-eye displays like virtual reality and augmented reality headsets and smart glasses, ...