TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new cold field emission cryo-electron microscope (cryo-EM), the CRYO ARM™ 300 II (JEM-3300), to be ...

The Hitachi S4000 Field Emission Scanning Electron Microscope (FESEM) with IXRF Energy-dispersive X-ray Spectrometer (EDS) is a cold field emission SEM that is fast and easy to use. Good for ...

Microscope can magnify objects greater than 1,000,000 times and will chiefly aid in research and development of nanomaterials, thin films SAN ANTONIO--(BUSINESS WIRE)--Southwest Research Institute is ...

In recent decades, the Field Emission Scanning Electron Microscope (FE-SEM) has become a cornerstone of analytical science, offering professionals across various scientific and engineering disciplines ...

(Nanowerk News) The National Institute for Materials Science (NIMS) and JEOL, Ltd. have developed a lanthanum hexaboride (LaB6) nanowire-based field emission gun that is installable on an ...

Tsukuba, Japan—Research and development of organic electronics such as organic solar cells and organic light-emitting diodes is rapidly advancing. The "shape" of the electron orbitals of organic ...

The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on ...

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Field emission scanning electron microscopy (FE-SEM) is a more powerful SEM imaging technique widely used in engineering for analysing the surface topography and composition of materials at high ...

The Hitachi SU70 Field Emission Scanning Electron Microscope (FESEM) with Oxford Energy-dispersive X-ray Spectrometer (EDS) is a top level research grade SEM with excellent performance both at low kV ...